大学化学 >> 2024, Vol. 39 >> Issue (3): 5-17.doi: 10.3866/PKU.DXHX202308107

所属专题： 晶体化学教学

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集成X射线、TEM和STM的晶体学教学尝试

马宏伟1,*(), 张芳1,*(), 艾惠1,*(), 张妞1, 彭绍春1, 李晖2   

  1. 1 北京理工大学分析测试中心, 北京 122488
    2 北京理工大学化学化工学院, 北京 122488
  • 收稿日期:2023-08-30 录用日期:2023-10-19 发布日期:2023-11-16
  • 通讯作者: 马宏伟,张芳,艾惠 E-mail:hwma@bit.edu.cn;fangzhang@bit.edu.cn;hecibit@163.com
  • 基金资助:
    国家自然科学基金(21471017)

Integrated Crystallographic Teaching with X-ray, TEM and STM

Hongwei Ma1,*(), Fang Zhang1,*(), Hui Ai1,*(), Niu Zhang1, Shaochun Peng1, Hui Li2   

  1. 1 Analysis and Testing Center, Beijing Institute of Technology, Beijing 122488, China
    2 School of Chemistry and Chemical Engineering, Beijing Institute of Technology, Beijing 122488, China
  • Received:2023-08-30 Accepted:2023-10-19 Published:2023-11-16
  • Contact: Hongwei Ma, Fang Zhang, Hui Ai E-mail:hwma@bit.edu.cn;fangzhang@bit.edu.cn;hecibit@163.com

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摘要：

以Si晶体为例，介绍了一种结合X-射线、电子显微学和扫描隧道显微技术进行晶体学教学的尝试。主要是从基本原理、实验技术、实验结果等方面建立不同方法之间的联系，也说明其区别。目的是使学生能依据基本的晶体学原理、概念和数据，理解不同的晶体结构分析和表征方法提供的晶体学信息之间的区别和联系，达到融会贯通的效果。

关键词: 晶体学, 教学, X-射线, TEM, STM

Abstract:

Using Si crystals as an illustrative example, an integrated approach to teaching crystallography with X-ray/electron diffraction and TEM/STM imaging, including the principles, technologies and results, was presented to help students building up the links among different crystallographic methods and technologies for structure characterization, so that they have a complete and integrated understanding of crystallographic concepts, theories and the results from different technologies.

Key words: Crystallography, Teaching, X-ray, TEM, STM