University Chemistry ›› 2024, Vol. 39 ›› Issue (3): 5-17.doi: 10.3866/PKU.DXHX202308107

Special Issue:

• Special Subject • Previous Articles     Next Articles

Integrated Crystallographic Teaching with X-ray, TEM and STM

Hongwei Ma1,*(), Fang Zhang1,*(), Hui Ai1,*(), Niu Zhang1, Shaochun Peng1, Hui Li2   

  1. 1 Analysis and Testing Center, Beijing Institute of Technology, Beijing 122488, China
    2 School of Chemistry and Chemical Engineering, Beijing Institute of Technology, Beijing 122488, China
  • Received:2023-08-30 Accepted:2023-10-19 Published:2023-11-16
  • Contact: Hongwei Ma, Fang Zhang, Hui Ai E-mail:hwma@bit.edu.cn;fangzhang@bit.edu.cn;hecibit@163.com

Abstract:

Using Si crystals as an illustrative example, an integrated approach to teaching crystallography with X-ray/electron diffraction and TEM/STM imaging, including the principles, technologies and results, was presented to help students building up the links among different crystallographic methods and technologies for structure characterization, so that they have a complete and integrated understanding of crystallographic concepts, theories and the results from different technologies.

Key words: Crystallography, Teaching, X-ray, TEM, STM